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1 article(s) from Xia, Xicheng

Material discrimination and mixture ratio estimation in nanocomposites via harmonic atomic force microscopy

Weijie Zhang,
Yuhang Chen,
Xicheng Xia and
Jiaru Chu

Beilstein J. Nanotechnol. 2017, 8, 2771–2780, doi:10.3762/bjnano.8.276

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Figure 1: Typical sixth harmonic amplitude images of a PS/LDPE blend with different amplitude set-points. (a)...

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Figure 2: Dependence of the sixth harmonic amplitude on the set-point. (a) Experimental results. (b) Numerica...

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Figure 3: Influence of drive frequency on the sixth harmonic amplitude. The fundamental free resonance freque...

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Figure 4: Harmonic amplitude contrast reversal when the drive frequency is altered. (a) Amplitude difference ...

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Figure 5: Typical harmonic amplitude images when the laser spot location on the cantilever beam is changed. T...

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Figure 6: Relation between the harmonic amplitude difference and the slope of the corresponding cantilever mo...

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Figure 7: AFM images of mixed PS and SiO₂ NPs on a silicon substrate. (a) Topography. (b) The 6th harmonic am...

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Figure 8: Harmonic AFM imaging of SiO₂/PS NPs mixed with different ratios. The two types of NPs have the same...

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Figure 9: Mixture ratio estimation of the SiO₂/PS composites.

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Published 21 Dec 2017

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